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- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Bruker Announces Agreement to Acquire Veeco's
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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News
- August 30, 2010
- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
At the 12th European Powder Diffraction Conference (EPDIC) in Darmstadt, Germany, Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists - sponsored by Bruker - for the invention of the Rietveld method. The EPDIC committee donated the price sponsored by Bruker to Dr....
- August 30, 2010
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
At recent Denver X-ray Conference and the presently running EPDIC/ECM conference in Darmstadt, Germany, the unique D2 PHASER desktop diffractometer with integrated X-ray fluorescence capabilities is introduced.
The novel D2 PHASER with XFlash detector represents the first desktop instrument...
- August 27, 2010
- View the updated SMART X2S structure gallery
Our SMART X2S desktop solution helps synthetic chemists to determine the single crystal structure of newly synthesized molecules close to their workbench. Our updated structure gallery gives an impression on capabilities of crystal-in, structure-out automation.
- August 26, 2010
- Bruker Announces Agreement to Acquire Veeco's
Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) Scientific Instruments Business
- August 10, 2010
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Bruker Nano, in cooperation with The Microbeam Analysis Society, is proud to announce that the Duncumb Award for Excellence in Microanalysis has been awarded to David C. Joy, Distinguished Professor at the University of Tennessee, Knoxville, and Distinguished Scientist at the Oak Ridge National...
- July 15, 2010
- Application Report XRD 12 - D8 FABLINE
X-Ray Reflectivity Study of Ultra Thin HfO2 Films
- June 2, 2010
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
Marvin Rowe (Professor Emeritus of Chemistry,Texas A&M University and Conservation Laboratory of the Museum of New Mexico) recently attended a Bruker Elemental workshop directed by Dr. Bruce Kaiser. His kind endorsement is noted below.
I just wanted to express my pleasure in and...
- May 18, 2010
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
Dennis Piechota (Conservator, Fiske Center for Archaeological Research, UMass Boston) recently hosted a Bruker Elemental workshop directed by Dr. Bruce Kaiser. His kind endorsement is noted below.
I recently hosted at UMass Boston a two-day handheld XRF Workshop taught by Dr Bruce Kaiser. I...
- May 14, 2010
- Bruker Elemental announces the winner of our S1 Sorter giveaway contest
KENNEWICK, Washington – May 14, 2010 – Bruker Elemental announces the winner of our S1 Sorter giveaway contest.
David Londeen of Metal Finishing Co. in Wichita, Kansas USA was the winner of the recent S1 Sorter giveaway contest. Congratulations David!
In the business-critical area of handheld...
- May 10, 2010
- Bruker Nano Publishes TXRF Training Package for Academia
Combining materials used in the last years in (web) seminars, Bruker XRF in-house and onsite training classes as well as new materials developed with academia, Bruker Nano offers a complete EDXRF/ TXRF (energy dispersive X-ray fluorescence analysis / total reflection X-ray fluorescence analysis)...