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- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Bruker Announces Agreement to Acquire Veeco's
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
