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Product News

  • At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
  • D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
  • Bruker Announces Agreement to Acquire Veeco's
  • Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
  • Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS

Upcoming Events

  • 4th International SAXS/GISAXS Workshop (PDF)
    Sep 09-11, Leoben, Austria
  • Navigated Atomic Force Microscopy - N8 NEOS
    Sep 15, Free Webinar
  • 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
    Sep 19-22, Karlsruhe, Germany
  • Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
    Sep 30, Free Webinar
  • COM2010 - Conference of Metallurgists
    Oct 03-06, Vancouver, British Columbia, Canada

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